VT-X750 Case Study
The X750 is used for non-destructive inspection of 5G
infrastructure/modules and in-vehicle electrical components as a
high-definition, high-quality inspection using full 3D-CT. In
recent years, the VT-X750 has been used for inspection of solder
voids and solder filling of through-hole connectors in final
assembly of power devices such as IGBTs and MOSFETs, which are
essential for EVs, as well as Integrated machine and electric
power. It has also been widely utilized in the fields of aerospace,
industrial equipment, and semiconductors.
In-line full inspection coverage [Omron Patent]
The VT-X750 improves upon previous Omron 3D-CT technology making it
the fastest X-Ray inspection system to date *¹.
The automated inspection logic has been improved for many parts
such as IC heal fillets, stacked devices (PoP), through hole
components, press-fit connectors, and other bottom terminated
parts.
Increasing automated inspection speed and expanding inspection
logic enables full, in-line inspection coverage by 3D-CT method.
*1. By an internal investigation in October, 2021.
* Time for all PCB inspection of M size substrate. Excluding PCB
load and unload time. It is the 3D inspection time both
sides of board including 2 pieces BGA which has 2,000 to 3,000
pins, or SiP.
Visualize solder joint strength
OMRON’s unique 3D-CT reconstruction algorithms provide excellent
solder shape recognition and defect detection.
Quantitative analysis allows for an automated inspection process
which minimizes the risk of escapes while providing fast and
repeatable operation.
Design constraint free
Dense and dual sided board design can provide challenges for X-Ray
inspection.
However, Omron's 3D-CT technology can overcome such design
restraints.
Criteria setting by Auto-Judge reduces the dependency on a
dedicated programmer [Patent Pending]
This dynamic approach enables a comprehensive analysis using Omron
AI with quantitative decision making based on conventional
inspection standards for OK / NG judgment.
(3D cross-sectional display functionality has been integrated into
the screen, making the inspection criteria settings easier to
understand.)
Faster creation of new programs [Omron Patent]
Omron AI assists in the quick creation of new programs. Along with
automated program generation using CAD data, Omron AI automatically
tunes the parts library using inspection result data.
Accelerated simulation for Patent Pending production preparation
[Omron Patent]
Omron AI simulates the optimum tact and exposure dosage for each
part and automatically determines the corresponding conditions for
the X-ray inspection process.
* Simulation pertains to specific parts.
Zero down time
To achieve “Never stop the production line = Zero downtime”, OMRON
provides global support for customer operations with a full range
of maintenance services, including machine monitoring for
predictive maintenance and remote access for emergency support.
Reduction of product radiation exposure
High speed and low radiation imaging technology
A filter that reduces the effects of radiation exposure has been
installed as standard, and concerns about radiation exposure,
especially to memory components, have been minimized by realizing
high-speed imaging.
Parts radiation exposure simulator [Omron Patent]
The exposure of each component on the top side and bottom side of
PCB can be simulated with high accuracy.
High-speed automated X-ray CT inspection system | GSSMT, Automated
X-ray Inspection, CT Imaging Technology, Inline X-ray Inspection,
3D X-ray CT Systems, High-Speed CT Scanning, X-ray Inspection for
Electronics, Non-Destructive Testing (NDT), X-ray Computed
Tomography Applications, Quality Assurance in Manufacturing,
Automated Defect Detection, X-ray Imaging Software, Real-Time X-ray
Analysis, High-Resolution X-ray Imaging, X-ray Inspection Systems
for Semiconductors, AI in X-ray Inspection, Robotic Sample Loading
Systems, X-ray CT for Aerospace Components, High-Throughput
Inspection Solutions, Precision Metrology with X-ray CT, Advanced
Imaging Techniques in Manufacturing
